課程資訊
課程名稱
掃描探針顯微術:基礎原理, 應用與實作
Scanning probe microscopy: Fundamental, Application, and Practice 
開課學期
105-1 
授課對象
理學院  物理學系  
授課教師
白偉武 
課號
Phys8131 
課程識別碼
222 D3450 
班次
 
學分
全/半年
半年 
必/選修
選修 
上課時間
星期四7,8(14:20~16:20) 
上課地點
新物716 
備註
總人數上限:30人
外系人數限制:6人 
 
課程簡介影片
 
核心能力關聯
本課程尚未建立核心能力關連
課程大綱
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課程概述

The course will introduce modern scanning probe microscopy (SPM) techniques, mainly scanning tunneling microscopy (STM) and atomic force microscopy (AFM). First, the principle of STM and AFM is discussed in details. Fundamental measurement methods and modes of operations in STM and AFM are then introduced. Selected examples in SPM applications in contemporary scientific and industrial research will be given. Advanced SPM techniques will be broadly covered and students are expected to participate in this part of discussion through oral presentation and literature survey. This course contains mandatory hand-on laboratory experiments, which can be either AFM or STM. 

課程目標
Upon completing this course, the student should be able to describe the basic physical and technical aspects of STM and AFM. For example, to describe quantum mechanical theory for tunneling in scanning tunneling microscopy (STM) and Tersoff-Hermann interpretation of LDOS. Or, to describe various forces acting in standard AFM modes. The student will know basic technical aspects of an SPM instrument and its limits. The student should be able to describe several examples and uses of SPM in various research fields and industries. Finally, the student should be able to operate an SPM instrument and obtain meaningful measurement independently. 
課程要求
Intended for students from 3rd year undergraduates to graduate students in physics and other science fields. This course will be taught partly in English and partly in Chinese. 
預期每週課後學習時數
 
Office Hours
備註: One hour immediately after each class 
參考書目
Scanning Probe Microscopy: The Lab on a Tip, 2004 Edition, by Ernst Meyer, Hans J. Hug, Roland Bennewitz, ISBN-13: 978-3540431800
Introduction to Scanning Tunneling Microscopy: Second Edition, by C. Julian Chen, , ISBN-13: 9780199211500
 
指定閱讀
Scanning Probe Microscopy and Spectroscopy: Methods and Applications, by Roland Wiesendanger, ISBN: 9780521428477 
評量方式
(僅供參考)
 
No.
項目
百分比
說明
1. 
oral presentations 
50% 
 
2. 
laboratory and reports 
50% 
 
 
課程進度
週次
日期
單元主題