週次 |
日期 |
單元主題 |
第03週 |
3/7 |
Opening
DRAM Design, Device (DEG) part1
What's DRAMDRAM Design, Device (DEG)
DRAM Application |
第04週 |
3/14 |
DRAM Design, Device (DEG) part2
DRAM Architecture
Product Testing
Dry Etch Process |
第05週 |
3/21 |
Photo Process |
第06週 |
3/28 |
Thin Film Process
Diffusion Process |
第08週 |
4/11 |
CMP Process
WET Process |
第09週 |
4/18 |
DRAM Advanced Defect detection
Methodology Application
DRAM probing and failure analysis |
第10週 |
4/25 |
Midterm exam |
第11週 |
5/2 |
SMAI(Smart Manufacturing & Artificial Intelligence)
Data engineering challenges in semiconductor data
Machine learning challenges in production
Deep learning for memory array failure classification |
第12週 |
5/9 |
Quality
CSM Overview & Machine Learning on Advanced Process Control
Data Science application in photolithography |
第13週 |
5/16 |
1. FAB AMC process & ESD/Cleanliness quality control
2. Incoming Material Quality control and detection introduction |
第14週 |
5/23 |
BE Package & Test
Assembly Package Introduction
Advanced package introduction - now and future |
第15週 |
5/30 |
Field Application Engineering
DRAM Basic Operations and (System) Design Considerations
Market requirements vs. different type of DRAM and trend
Features of DDR4/DDR5/LPDDR4/LPDDR5/GDDR6x
Near Memory, Main Memory and Far Memory
High speed memory design guide and considerations |
第16週 |
6/6 |
Final exam, TA interaction with students open discussion |