課程資訊
課程名稱
電子顯微鏡學
Electron Microscopy 
開課學期
108-1 
授課對象
工學院  材料科學與工程學研究所  
授課教師
顏鴻威 
課號
MSE7015 
課程識別碼
527 M1270 
班次
 
學分
3.0 
全/半年
半年 
必/選修
選修 
上課時間
星期五2,3,4(9:10~12:10) 
上課地點
共203 
備註
限碩士班以上
總人數上限:110人
外系人數限制:5人 
Ceiba 課程網頁
http://ceiba.ntu.edu.tw/1081MSE7015_ 
課程簡介影片
 
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課程概述

1. Contemporary materials research strongly relies on understanding physics of structure, microstructure, and defects. This is enabled by microscopy and microanalysis from different facilities.
2. Essentials of electron microscopy contains many topics for fundamental education, such as scattering, diffraction, contrast formation, spectroscopy.
3. NTU students should know that the late president Luk Chi-Hung (陸志鴻) guided our materials research toward microstructure and defects. Hence, Electron Microscopy is the classic course in the department/institute.
4. The targets of this course includes
(1) realizing instrumental operation in electron microscope;
(2) understanding electron diffraction in crystal;
(3) understanding origins of contrast in electron microscope;
(4) understanding origins of signals in microanalysis.
5. The students passing this course should
(1) be ready to learn operations of TEM/SEM;
(2) well explain contrast-microstructure and diffraction-crystal relationships;
(3) well understand essentials in microanalysis.
 

課程目標
1. To catch the configuration of SEM, TEM, and STEM
2. To understand interactions between electron and matter
3. To overview the theory of diffraction
4. To understand the contrast principle
5. To learn the methods of sample preparation
6. To understand how electron microscopy helps materials research 
課程要求
1. At the least, Introduction to Materials Science MSE1008
2. At the best, Materials Characterizations MSE5003 and Theory of Diffraction MSE 5030
3. Maybe top-up, Surface Analysis MSE5048 and Materials Microstructure & Defects MSE5051
 
預期每週課後學習時數
 
Office Hours
 
參考書目
1. David, B. Williams & C. Barry Carter, Transmission Electron Microscopy: A
Textbook for Materials Science: Part1~Part4
2. Brent Fultz & James M. Howe, Transmission Electron Microscopy and
Diffractometry of Materials, 2nd Edition
3. 鮑忠興 & 劉思謙,近代穿透式電子顯微鏡實務, 2nd Edition
4. M.H. Loretto, Electron Beam Analysis of Materials, 2nd Edition
 
指定閱讀
待補 
評量方式
(僅供參考)
 
No.
項目
百分比
說明
1. 
Homework 
50% 
 
2. 
Midterm Exam 
30% 
 
3. 
Final Exam 
30% 
 
4. 
Bonus 
5% 
 
 
課程進度
週次
日期
單元主題
第1週
9/13  中秋節停課 
第2週
9/20  Chapter 1 Why Electron Microscope
 
第3週
9/27  Chapter 2 Instrumentation (Transmission Electron Microscopy)  
第4週
10/04  Chapter 3 Electron Scattering 
第5週
10/05  Chapter 4 Electron Diffraction  
第6週
10/18  Chapter 4 Electron Diffraction 
第7週
10/25  Chapter 5 Diffraction Contrast 
第8週
11/01  Chapter 5 Diffraction Contrast 
第9週
11/08  Midterm Exam 
第10週
11/15  Chapter 0 Sample Preparation 
第11週
11/22  Chapter 6 Phase Contrast & High-Resolution TEM 
第12週
11/29  Chapter 7 Scanning Electron Microscopy 
第13週
12/06  Chapter 8 Scanning Transmission Electron Microscopy 
第14週
12/13  Chapter 9 X-ray Energy Dispersive Spectrum 
第15週
12/20  Chapter 10 Electron Energy Loss Spectrum 
第16週
12/27  Chapter 11 Electron Backscattering Diffraction 
第17週
1/03  Chapter 12 Atom Probe Tomography 
第18週
1/10  Final Exam