課程名稱 |
電子顯微鏡學 Electron Microscopy |
開課學期 |
108-1 |
授課對象 |
工學院 材料科學與工程學研究所 |
授課教師 |
顏鴻威 |
課號 |
MSE7015 |
課程識別碼 |
527 M1270 |
班次 |
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學分 |
3.0 |
全/半年 |
半年 |
必/選修 |
選修 |
上課時間 |
星期五2,3,4(9:10~12:10) |
上課地點 |
共203 |
備註 |
限碩士班以上 總人數上限:110人 外系人數限制:5人 |
Ceiba 課程網頁 |
http://ceiba.ntu.edu.tw/1081MSE7015_ |
課程簡介影片 |
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核心能力關聯 |
核心能力與課程規劃關聯圖 |
課程大綱
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課程概述 |
1. Contemporary materials research strongly relies on understanding physics of structure, microstructure, and defects. This is enabled by microscopy and microanalysis from different facilities.
2. Essentials of electron microscopy contains many topics for fundamental education, such as scattering, diffraction, contrast formation, spectroscopy.
3. NTU students should know that the late president Luk Chi-Hung (陸志鴻) guided our materials research toward microstructure and defects. Hence, Electron Microscopy is the classic course in the department/institute.
4. The targets of this course includes
(1) realizing instrumental operation in electron microscope;
(2) understanding electron diffraction in crystal;
(3) understanding origins of contrast in electron microscope;
(4) understanding origins of signals in microanalysis.
5. The students passing this course should
(1) be ready to learn operations of TEM/SEM;
(2) well explain contrast-microstructure and diffraction-crystal relationships;
(3) well understand essentials in microanalysis.
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課程目標 |
1. To catch the configuration of SEM, TEM, and STEM
2. To understand interactions between electron and matter
3. To overview the theory of diffraction
4. To understand the contrast principle
5. To learn the methods of sample preparation
6. To understand how electron microscopy helps materials research |
課程要求 |
1. At the least, Introduction to Materials Science MSE1008
2. At the best, Materials Characterizations MSE5003 and Theory of Diffraction MSE 5030
3. Maybe top-up, Surface Analysis MSE5048 and Materials Microstructure & Defects MSE5051
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預期每週課後學習時數 |
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Office Hours |
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指定閱讀 |
待補 |
參考書目 |
1. David, B. Williams & C. Barry Carter, Transmission Electron Microscopy: A
Textbook for Materials Science: Part1~Part4
2. Brent Fultz & James M. Howe, Transmission Electron Microscopy and
Diffractometry of Materials, 2nd Edition
3. 鮑忠興 & 劉思謙,近代穿透式電子顯微鏡實務, 2nd Edition
4. M.H. Loretto, Electron Beam Analysis of Materials, 2nd Edition
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評量方式 (僅供參考) |
No. |
項目 |
百分比 |
說明 |
1. |
Homework |
50% |
|
2. |
Midterm Exam |
30% |
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3. |
Final Exam |
30% |
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4. |
Bonus |
5% |
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週次 |
日期 |
單元主題 |
第1週 |
9/13 |
中秋節停課 |
第2週 |
9/20 |
Chapter 1 Why Electron Microscope
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第3週 |
9/27 |
Chapter 2 Instrumentation (Transmission Electron Microscopy) |
第4週 |
10/04 |
Chapter 3 Electron Scattering |
第5週 |
10/05 |
Chapter 4 Electron Diffraction |
第6週 |
10/18 |
Chapter 4 Electron Diffraction |
第7週 |
10/25 |
Chapter 5 Diffraction Contrast |
第8週 |
11/01 |
Chapter 5 Diffraction Contrast |
第9週 |
11/08 |
Midterm Exam |
第10週 |
11/15 |
Chapter 0 Sample Preparation |
第11週 |
11/22 |
Chapter 6 Phase Contrast & High-Resolution TEM |
第12週 |
11/29 |
Chapter 7 Scanning Electron Microscopy |
第13週 |
12/06 |
Chapter 8 Scanning Transmission Electron Microscopy |
第14週 |
12/13 |
Chapter 9 X-ray Energy Dispersive Spectrum |
第15週 |
12/20 |
Chapter 10 Electron Energy Loss Spectrum |
第16週 |
12/27 |
Chapter 11 Electron Backscattering Diffraction |
第17週 |
1/03 |
Chapter 12 Atom Probe Tomography |
第18週 |
1/10 |
Final Exam |
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