課程名稱 |
電子顯微鏡學 Electron Microscopy |
開課學期 |
107-1 |
授課對象 |
學程 高分子科技學程 |
授課教師 |
顏鴻威 |
課號 |
MSE7015 |
課程識別碼 |
527 M1270 |
班次 |
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學分 |
3.0 |
全/半年 |
半年 |
必/選修 |
選修 |
上課時間 |
星期五2,3,4(9:10~12:10) |
上課地點 |
新204 |
備註 |
限碩士班以上 總人數上限:80人 外系人數限制:5人 |
Ceiba 課程網頁 |
http://ceiba.ntu.edu.tw/1071MSE7015_ |
課程簡介影片 |
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核心能力關聯 |
核心能力與課程規劃關聯圖 |
課程大綱
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課程概述 |
Here, we will learn the principles of electron microscopy, especially applied in materials science and engineering. We will go over electron scattering, diffraction, image contrast, and microanalysis. All these are related to microscopy techniques including electron diffraction, diffraction contrast, phase contrast, Z contrast, energy-dispersive X-Ray spectrum, electron energy loss spectrum, and electron backscattering diffraction. |
課程目標 |
1. To catch the configuration of SEM, TEM, and STEM
2. To understand interactions between electron and matter
3. To overview the theory of diffraction
4. To understand the contrast principle
5. To learn the methods of sample preparation
6. To understand how electron microscopy helps materials research |
課程要求 |
1. Materials Science and Engineering
2. Crystallography
3. Diffraction (optional) |
預期每週課後學習時數 |
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Office Hours |
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指定閱讀 |
待補 |
參考書目 |
1. Transmission Electron Microscopy and Diffractometry of Materials, 2nd Edition; Brent Fultz, James M. Howe, 2001; ISBN 3-540-67841-7.
2. 近代穿透式電子顯微鏡實務 2nd Edition; 鮑忠興 & 劉思謙; ISBN 9789865937225.
3. Electron Beam Analysis of Materials, 2nd Edition, M.H. Loretto; ISBN 0-412-47790-4. |
評量方式 (僅供參考) |
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週次 |
日期 |
單元主題 |
第1週 |
9/14 |
Why Electron Microscopy |
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