課程名稱 |
電子顯微鏡學 Electron Microscopy |
開課學期 |
105-1 |
授課對象 |
工學院 材料科學與工程學研究所 |
授課教師 |
顏鴻威 |
課號 |
MSE7015 |
課程識別碼 |
527 M1270 |
班次 |
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學分 |
3 |
全/半年 |
半年 |
必/選修 |
選修 |
上課時間 |
星期五2,3,4(9:10~12:10) |
上課地點 |
工綜B03 |
備註 |
限碩士班以上 總人數上限:50人 |
Ceiba 課程網頁 |
http://ceiba.ntu.edu.tw/1051MSE7015_ |
課程簡介影片 |
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核心能力關聯 |
核心能力與課程規劃關聯圖 |
課程大綱
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課程概述 |
Here, we will learn the principles of electron microscopy, especially applied in materials science and engineering. We will go over electron scattering, diffraction, image contrast, and microanalysis. All these are related to microscopy techniques including electron diffraction, diffraction contrast, phase contrast, Z contrast, energy-dispersive X-Ray spectrum, electron energy loss spectrum, and electron backscattering diffraction. |
課程目標 |
1. To catch the configuration of SEM, TEM, and STEM
2. To understand interactions between electron and matter
3. To overview the theory of diffraction
4. To understand the contrast principle
5. To learn the methods of sample preparation
6. To understand how electron microscopy helps materials research |
課程要求 |
1. Materials Science and Engineering
2. Crystallography
3. Diffraction (optional) |
預期每週課後學習時數 |
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Office Hours |
每週一 14:00~17:00 |
指定閱讀 |
Lecture notes |
參考書目 |
Reference Book
1. Transmission Electron Microscopy and Diffractometry of Materials, 2nd Edition; Brent Fultz, James M. Howe, 2001; ISBN 3-540-67841-7.
2. 近代穿透式電子顯微鏡實務 2nd Edition; 鮑忠興 & 劉思謙; ISBN 9789865937225.
3. Electron Beam Analysis of Materials, 2nd Edition, M.H. Loretto; ISBN 0-412-47790-4.
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評量方式 (僅供參考) |
No. |
項目 |
百分比 |
說明 |
1. |
Homework |
30% |
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2. |
Midterm Exam |
35% |
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3. |
Final Exam |
35% |
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週次 |
日期 |
單元主題 |
第1週 |
9/16 |
Course Overview (announced by TA) |
第2週 |
9/23 |
Ch.1 Why electron microscope |
第3週 |
9/30 |
Ch.2 Configuration of electron microscope |
第4週 |
10/07 |
Ch.3 Electron Scattering - Basic View |
第5週 |
10/14 |
Ch.4. Electron Diffraction |
第6週 |
10/21 |
Ch.4 Electron Diffraction |
第7週 |
10/28 |
Ch.5 Diffraction Contrast |
第8週 |
11/04 |
Ch.5 Diffraction Contrast |
第9週 |
11/11 |
Midterm Exam |
第10週 |
11/18 |
Ch.6 Phase Contrast |
第11週 |
11/25 |
Ch.7 Scanning Electron Microscope |
第12週 |
12/02 |
Ch.8 Scanning transmission electron microscope |
第13週 |
12/09 |
Ch. 9 X-Ray energy-dispersive diffraction |
第14週 |
12/16 |
Ch. 10 Electron energy loss spectrum |
第15週 |
12/23 |
Ch. 11 Electron backscattering diffraction/Atom probe tomography |
第16週 |
12/30 |
Ch. 12 Sample preparation |
第17週 |
1/06 |
EBSD or others |
第18週 |
1/13 |
final exam |
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