課程名稱 |
繞射原理 Theory of Diffraction |
開課學期 |
103-1 |
授課對象 |
工學院 材料科學與工程學系 |
授課教師 |
溫政彥 |
課號 |
MSE5030 |
課程識別碼 |
527 U3140 |
班次 |
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學分 |
3 |
全/半年 |
半年 |
必/選修 |
必帶 |
上課時間 |
星期四2,3,4(9:10~12:10) |
上課地點 |
新502 |
備註 |
限本系所學生(含輔系、雙修生) 總人數上限:60人 |
Ceiba 課程網頁 |
http://ceiba.ntu.edu.tw/1031diffraction |
課程簡介影片 |
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核心能力關聯 |
本課程尚未建立核心能力關連 |
課程大綱
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課程概述 |
X-ray and electron diffraction methods are very useful for material researches. Various techniques have been developed for studying crystal structures, identifying and quantifying phases, determining crystal orientations and obtaining many other structural properties of materials. In this course, we will first introduce basic crystallography of materials and then discuss the fundamental concepts of diffraction, principle of diffraction, and the mathematical methods to solve the diffraction problems. Diffraction methods, practical considerations, and examples will be discussed in the lectures. |
課程目標 |
In this course, students will learn:
1. Basic crystallography of materials.
2. Properties of X-rays.
3. Principle of diffractions.
4. Concepts of the reciprocal lattice.
5. The Ewald construction.
6. Mathematical tools for simplifying diffraction problems - Fourier transform and the convolution theory.
7. Diffraction methods.
8. Crystal structure analysis. |
課程要求 |
待補 |
預期每週課後學習時數 |
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Office Hours |
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指定閱讀 |
Elements of X-ray Diffraction, Cullity and Stack, 3rd Ed., Prentice Hall (2001).
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參考書目 |
Introduction to Diffraction in Materials Science and Engineering, Aaron D. Krawitz, John
Wiley & Sons (2001).
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評量方式 (僅供參考) |
No. |
項目 |
百分比 |
說明 |
1. |
Homework |
15% |
5 problem sets |
2. |
Quiz 1 |
20% |
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3. |
Quiz 2 |
25% |
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4. |
Final Exam |
30% |
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5. |
Final project report |
10% |
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週次 |
日期 |
單元主題 |
第1週 |
9/18 |
Introduction, plane lattices, Bravais lattice |
第2週 |
9/25 |
Lattice planes, symmetry operation and elements |
第3週 |
10/2 |
Basic crystallography (I) |
第4週 |
10/9 |
Basic crystallography (II) |
第5週 |
10/16 |
Basic crystallography (III) |
第6週 |
10/23 |
Quiz I |
第7週 |
10/30 |
The reciprocal lattice and the Fourier transform |
第8週 |
11/6 |
Fourier transform and the convolution theorem |
第9週 |
11/13 |
Properties of X-rays |
第10週 |
11/20 |
The Laue equations, Ewald construction, and principle of diffraction |
第11週 |
11/27 |
Diffraction phenomenon and the application of the Ewald construction |
第12週 |
12/4 |
Intensity of diffraction; diffraction methods |
第13週 |
12/11 |
Quiz II |
第14週 |
12/18 |
Electron diffraction; the interference function; Scherrer equation |
第15週 |
12/25 |
Integrated intensity, absorption factor, temperature factor |
第16週 |
1/1 |
Holiday |
第17週 |
1/15 |
Phase identification; crystal structure determination |
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