課程資訊
課程名稱
高科技產業材料應用與分析
MATERIALS APPLICATIONS AND ANALYSIS IN HIGH-TECH INDUSTRY 
開課學期
99-1 
授課對象
工學院  應用力學研究所  
授課教師
陳建彰 
課號
AM7058 
課程識別碼
543EM5240 
班次
 
學分
全/半年
半年 
必/選修
選修 
上課時間
星期五6,7,8(13:20~16:20) 
上課地點
應107 
備註
本課程以英語授課。本課程以英語授課。
總人數上限:35人 
Ceiba 課程網頁
http://ceiba.ntu.edu.tw/991Matter 
課程簡介影片
 
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課程概述

The detailed content of this course will be updated every year. In this semister, the content will include the semiconductor fundamentals, solar cells and materials analysis tools. 

課程目標
In this course, students will learn the fundamentals of semiconductor physics and solar cells, as well as the material analysis tools. The target is to help students build up insights for semiconductor and solar cell materials application, to train students using the materials R&D tools to improve the competitiveness in high-tech industries. 
課程要求
General physics,
General chemistry,
Engineering Mathematics 
預期每週課後學習時數
 
Office Hours
 
指定閱讀
 
參考書目
☆★Optoelectronics and Photonics, by S. O. Kasap, McGraw-Hill 2001.
☆★Solid State Electronic Devices, by B. G. Streetman, Prentice Hall.
☆★Physics of Solar Cells, by P. Wurfel, Wiley-VCH.
☆★Handbook of Photovoltaic Science and Engineering. Edited by A. Luque and
S. Hegedus, John Wiley & Sons, 2003.
☆ Principles of Electronic Materials and Devices, by S. O. Kasap, McGraw-
Hill 2005.
☆ Engineering Materials 1: An Introduction to Properties, Applications and
Design, by Michael F. Ashby and David R. H. Jones, Elsevier 2005.
☆ Scanning Electron Microscopy and X-ray Microanalysis, R. E. Lee, Prentice-
Hall, 1993.
☆ Elements of X-ray Diffraction, B. D. Cullity, Addison Wesley.
☆ Principles of instrumental analysis, by D. A. Skoog, F. J. Holler, S. R.
Crouch, Belmont, CA: Thomson Brooks/Cole, 2007.
Understanding Materials Science, Rolf E. Hummel, Springer, 1997.
Materials – Engineering, Science, Processing and Design, by M. Ashby, H.
Shercliff, and D. Cebon, Elsevier 2007.
Instrumental Methods of Analysis, H. H. Willard, L. L. Merritt Jr, J. A. Dean,
F. A. Settle Jr., Wadsworth.
Surface analysis techniques and applications, edt by W. Neagle, D. R. Randell,
Cambridge, Royal Society of Chemistry, 1990.
An introduction to surface analysis by XPS and AES, by J. F. Watts and J.
Wolstenholme, New York: J. Wiley, 2003.
 
評量方式
(僅供參考)
   
課程進度
週次
日期
單元主題
Week 1
9/17  Semiconductor Fundamentals 
Week 2
9/24  Semiconductor Fundamentals 
Week 3
10/01  Semiconductor Fundamentals 
Week 4
10/08  Semiconductor Fundamentals 
Week 5
10/15  Semiconductor Fundamentals 
Week 6
10/22  Semiconductor Fundamentals 
Week 7
10/29  Solar cell fundamentals 
Week 8
11/05  Solar cell fundamentals 
Week 9
11/12  Solar cell fundamentals
 
Week 10
11/19  Solar cell fundamentals 
Week 11
11/26  Solar cell fundamentals 
Week 12
12/03  Solar cell fundamentals 
Week 13
12/10  Materials analysis 
Week 14
12/17  Materials analysis 
Week 15
12/24  Materials analysis 
Week 16
12/31  Material analysis 
Week 17
1/07  Oral reports