課程名稱 |
積體電路測試 Vlsi Testing |
開課學期 |
100-1 |
授課對象 |
電機資訊學院 電子工程學研究所 |
授課教師 |
李建模 |
課號 |
EEE5001 |
課程識別碼 |
943EU0010 |
班次 |
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學分 |
3 |
全/半年 |
半年 |
必/選修 |
選修 |
上課時間 |
星期三2,3,4(9:10~12:10) |
上課地點 |
電二225 |
備註 |
本課程以英語授課。 總人數上限:80人 |
Ceiba 課程網頁 |
http://ceiba.ntu.edu.tw/1001_vlsitesting |
課程簡介影片 |
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核心能力關聯 |
核心能力與課程規劃關聯圖 |
課程大綱
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課程概述 |
This course introduces test techniques for VLSI circuits. Important issues and their solutions will be covered. Homework includes hand written and computer assignments (in C or C++). A final team project is also required.
outline
INTRODUCTION
LOGIC SIMULATION
FAULT MODELING
FAULT SIMULATION
TESTABILITY ANALYSIS
COMBINATIONAL ATPG
SEQUENTIAL ATPG
DELAY TESTS
FUNCTIIONAL TESTS
DIAGNOSIS
DESIGN FOR TESTABILITY
BUILT-IN SELF TEST
MEMORY TESTING
SOC TESTING
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課程目標 |
Learn the important VLSI testing techniques.
Be able to implement test-related algorithms in computer programs.
Team work with other students to solve specific problem in testing.
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課程要求 |
GRADING
HOMEWORK: 40%
EXAM: 30%
TERM PROJECT: 30%
PARTICIPATION 2%
PREREQUISITES
LOGIC DESIGN
COMPUTER PROGRAMMING
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預期每週課後學習時數 |
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Office Hours |
另約時間 |
指定閱讀 |
NONE |
參考書目 |
WANG, WU, WEN, "VLSI TEST PRINCIPLES AND ARCHITECTURES, MORGAN KUFFMAN, 2006.
M.L. BUSHNELL, V.D. AGRAWAL, “ESSENTIALS OF ELECTRONIC TESTING,” KLUWER ACADEMIC PUBLISHERS, 2000.
M. ABRAMOVICI, M.A. BREUER, AND A.D. FRIDEMAN, “DIGITAL SYSTEMS TESTING AND TESTABLE DESIGN,” IEEE PRESS 1995. |
評量方式 (僅供參考) |
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週次 |
日期 |
單元主題 |
Week 1 |
09/14 |
Introduction |
Week 2 |
09/21 |
International Test Conf. NO CLASS |
Week 3 |
09/28 |
Logic Sim. Fault sim. |
Week 4 |
10/05 |
Testability Measure |
Week 5 |
10/12 |
comb ATPG |
Week 6 |
10/19 |
Sequential ATPG |
Week 7 |
10/26 |
Delay tests |
Week 8 |
11/02 |
Diagnosis |
Week 9 |
11/09 |
Built-in Self Test (I) |
Week 10 |
11/16 |
Built-in Self Test (II) |
Week 11 |
11/23 |
ATS (No class) |
Week 12 |
11/30 |
Design for Testability (I) |
Week 13 |
12/07 |
Design for Testability (II)
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Week 14 |
12/14 |
Test without fault models |
Week 15 |
12/21 |
Presentation; Defect based testing |
Week 16 |
12/28 |
Additional Topics (memory testing) |
Week 17 |
01/04 |
Final Exam |
Week 18 |
01/11 |
Project Presentation |
Week 2-1 |
補課 |
Logic Simulation, Fault models, fault collapsing |
Week 11-1 |
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Test Compression |
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